

San Francisco, California,
USA |
3 - 6 September 2002
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The 15th International Internet & Software
Quality Week Technical Program is reviewed by a
distinguished International Board of Advisors listed below.
Advisory Members are chosen for their expertise in software testing and internet quality,
software quality process, and software quality issues as well as
for their contributions to the software quality field.
Quality Week seeks a balance between industrial, government, vendor, and academic backgrounds.
In view of the international aspect of the conference the Advisory Board
includes members from many countries throughout the
world.
Papers at QW2002 are reviewed by a majority of the Advisory
Board's members.
Paper selections are based on the QW2002 Advisory
Board's technical content and presentation evaluation scores.
Click on a QW2002 board memeber's name for a brief biographical
description. Email address information and an active link to each members'
personal home page is included where known.
Dr. Selim Aissi,
Intel, USA
Mr. James Bach,
Satisfice, USA
Dr. Boris Beizer,
Analysis, USA
Mr. Nick Borelli,
Microsoft, USA
Ms. Rita Bral,
SR/Institute, USA
(QW2002 Conference
Director)
Mr. Hans Buwalda,
LogiGear, USA
Mr. Olivier Denoo,
ps_testware, Belgium
Mr. Thomas Drake,
Consultant, USA
Mr. William Everett,
SPRE, USA
Mr. Danny Faught,
Tejas Software Consulting, USA
Mr. Laurent Gharda,
Consultant, USA
Mr. Bernard Homes,
Tessco, France
Dr. Cem Kaner,
Florida Institute of Technology, USA
Dr. Guenter Koch,
ARCS, Austria
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Dr. Atif Memon,
University of Maryland, USA
Dr. Edward Miller,
SR/Institute, USA
(QW2002 Program Chair)
Dr. John D. Musa,
Consultant, USA
Mr. Bret Pettichord,
BMC Software, Inc., USA
Mr. Greg Pope,
Consultant, USA
Mr. Uma P. Reddi,
LLNL, USA
Mr. Raymond Rivest,
CRIM, Canada
Dr. Linda Rosenberg,
NASA, USA
Mr. Rob Sabourin,
AmiBug, Canada
Mr. Chris Schotanus,
CMG, Europe
Mr. Erik Simmons,
Intel, USA
Dr. Wei-Tek Tsai,
Arizona State University, USA
Ms. Dolores Wallace,
SRS, USA
Mr. Steve Whitchurch,
Mentor Graphics, Corp., USA
Dr. Denise Woit,
Ryerson Polytechnic University, Canada
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